Diagnostic Instruments D10 NEF F-Mount Camera Adapter PLAN APO LEICA MZ12

LEICA MZ12

Silicon wafer backside and through-silicon inspection at 50× requiring maximum working clearance

this objective provides a wide field of view for rapid specimen survey and navigation — the ideal starting point in a multi-magnification NIR inspection workflow before stepping up to higher magnification M Plan Apo NIR objectives

Field Number

NIKON 40X DIC OBJECTIVE RMS THREAD

Diagnostic Instruments D10 NEF F-Mount Camera Adapter PLAN APO LEICA MZ12DIAGNOSTIC INSTRUMENTS D10NEF 1. 0 X F MOUNT WITH FOCUS ADJUSTMENT FOR NIKON ECLIPSE MICROSCOPES F MOUNT CATALOG NUMBER: D10 NEF CONDITION: EXCELLENT UNIVERSITY PURCHASE ORDERS ACCEPTED THANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS