Zeiss Epiplan-Neofluar 20x Brightfield Darkfield DIC Objective U-DO3 edge detection
Description
edge detection
Contact us for compatibility verification with your specific microscope model
🌊 Surface Topography — reveals surface height variations and texture with exceptional contrast
the analyzer is placed in the reflected or transmitted light path after the specimen
it provides a generous field of view with reliable contrast
Zeiss Epiplan-Neofluar 20x Brightfield Darkfield DIC Objective U-DO3 edge detectionZeiss Epiplan Neofluar 20X BD DIC Microscope Objective for Reflected Light Microscopy High performance Epiplan Neofluar objective for reflected light microscopy 20X magnification with 0. 50 numerical aperture for versatile imaging Neofluar optics deliver superior chromatic correction and high contrast Multi contrast capability: Brightfield, Darkfield, and DIC compatible M27 thread compatible with Zeiss Axio series microscope systems Excellent
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